Innovative practices session 6C DFT for functional safety

Prashant Goteti, Sreejit Chakravarty. Innovative practices session 6C DFT for functional safety. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1, IEEE, 2017. [doi]

Abstract

Abstract is missing.