Shirisha Gourishetty, Harshini Mandadapu, Andleeb Zahra, Zia Abbas. A Highly Accurate Machine Learning Approach to Modelling PVT Variation Aware Leakage Power in FinFET Digital Circuits. In 2019 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2019, Bangkok, Thailand, November 11-14, 2019. pages 61-64, IEEE, 2019. [doi]
Abstract is missing.