Multi-scale rigid registration to detect damage in micro-CT images of progressively loaded bones

Richard Green, Jim Graham, Hugh Devlin. Multi-scale rigid registration to detect damage in micro-CT images of progressively loaded bones. In Proceedings of the 8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2011, March 30 - April 2, 2011, Chicago, Illinois, USA. pages 1231-1234, IEEE, 2011. [doi]

Abstract

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