H. Grigoryan, G. Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian. Generic BIST architecture for testing of content addressable memories. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 86-91, IEEE, 2011. [doi]
Abstract is missing.