Jie Gu, John Keane, Chris H. Kim. Modeling and analysis of leakage induced damping effect in low voltage LSIs. In Wolfgang Nebel, Mircea R. Stan, Anand Raghunathan, Jörg Henkel, Diana Marculescu, editors, Proceedings of the 2006 International Symposium on Low Power Electronics and Design, 2006, Tegernsee, Bavaria, Germany, October 4-6, 2006. pages 382-387, ACM, 2006. [doi]
Abstract is missing.