Specification-Driven Conformance Checking for Virtual/Silicon Devices Using Mutation Testing

Haifeng Gu, Jianning Zhang, Mingsong Chen, Tongquan Wei, Li Lei, Fei Xie. Specification-Driven Conformance Checking for Virtual/Silicon Devices Using Mutation Testing. IEEE Transactions on Computers, 70(3):400-413, 2021. [doi]

Abstract

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