An Approach of Single-Crystal Defect Detection Using X-Ray Orientation Instrument

Shouping Guan, Yuyong Wang, Xiangming Chen. An Approach of Single-Crystal Defect Detection Using X-Ray Orientation Instrument. IEEE T. Instrumentation and Measurement, 68(10):4122-4134, 2019. [doi]

Authors

Shouping Guan

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Yuyong Wang

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Xiangming Chen

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