Valentin Guerlesquin. How (not) to remove technical debt in testing environments: six good way to fail. In Paris Avgeriou, Klaus Schmid, editors, Proceedings of the Second International Conference on Technical Debt, TechDebt@ICSE 2019, Montreal, QC, Canada, May 26-27, 2019. pages 1-2, IEEE / ACM, 2019. [doi]
Abstract is missing.