Automatic layout integration of Bulk Built-In Current Sensors for detection of soft errors

Mario Vinicius Guimaraes, Frank Sill Torres. Automatic layout integration of Bulk Built-In Current Sensors for detection of soft errors. In 29th Symposium on Integrated Circuits and Systems Design, SBCCI 2016, Belo Horizonte, Brazil, August 29 - September 3, 2016. pages 1-6, IEEE, 2016. [doi]

Abstract

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