Functional Fmax test-time reduction using novel DFTs for circuit initialization

Ujjwal Guin, Tapan J. Chakraborty, Mohammad Tehranipoor. Functional Fmax test-time reduction using novel DFTs for circuit initialization. In 2013 IEEE 31st International Conference on Computer Design, ICCD 2013, Asheville, NC, USA, October 6-9, 2013. pages 1-6, IEEE, 2013. [doi]

Abstract

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