Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas. Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. Microelectronics Reliability, 44(9-11):1781-1786, 2004. [doi]
Abstract is missing.