On Generation of Delay Test with Capture Power Safety

Rohini Gulve, Nihar Hage. On Generation of Delay Test with Capture Power Safety. In Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh, editors, VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Volume 711 of Communications in Computer and Information Science, pages 607-618, Springer, 2017. [doi]

Authors

Rohini Gulve

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Nihar Hage

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