Norman G. Gunther, Emad Hamadeh, Darrell Niemann, Iliya Pesic, Mahmud Rahman. Modeling Intrinsic Fluctuations in Decananometer MOS Modeling Intrinsic Fluctuations in Decananometer MOS. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 510-515, IEEE Computer Society, 2005. [doi]
Abstract is missing.