Speed-Path Debug Using At-Speed Scan Test Patterns

Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai. Speed-Path Debug Using At-Speed Scan Test Patterns. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 11-16, IEEE Computer Society, 2009. [doi]

Abstract

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