Jianghao Guo, Qiang Han, Wen-Ben Jone, Yu-Liang Wu. A cross-layer fault-tolerant design method for high manufacturing yield and system reliability. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 71-76, IEEE, 2013. [doi]
@inproceedings{GuoHJW13,
title = {A cross-layer fault-tolerant design method for high manufacturing yield and system reliability},
author = {Jianghao Guo and Qiang Han and Wen-Ben Jone and Yu-Liang Wu},
year = {2013},
doi = {10.1109/DFT.2013.6653585},
url = {http://dx.doi.org/10.1109/DFT.2013.6653585},
researchr = {https://researchr.org/publication/GuoHJW13},
cites = {0},
citedby = {0},
pages = {71-76},
booktitle = {2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013},
publisher = {IEEE},
}