Xinfei Guo, Mircea R. Stan. Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery. In 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN Workshops 2017, Denver, CO, USA, June 26-29, 2017. pages 184-191, IEEE Computer Society, 2017. [doi]
Abstract is missing.