Sandeep Gupta, Miron Abramovici, Magdy Abadir, Sridhar Narayanan. Keynote address tribute to Professor Mel Breuer: Contributions to CAD and Test. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1, IEEE, 2017. [doi]
Abstract is missing.