Optimization of Multiple Physical Phenomena through a Universal Metric in Junctionless Transistors

Manish Gupta, Abhinav Kranti. Optimization of Multiple Physical Phenomena through a Universal Metric in Junctionless Transistors. In 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems, VLSID 2019, Delhi, India, January 5-9, 2019. pages 168-173, IEEE, 2019. [doi]

Abstract

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