Optimization of Multiple Physical Phenomena through a Universal Metric in Junctionless Transistors

Manish Gupta, Abhinav Kranti. Optimization of Multiple Physical Phenomena through a Universal Metric in Junctionless Transistors. In 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems, VLSID 2019, Delhi, India, January 5-9, 2019. pages 168-173, IEEE, 2019. [doi]

@inproceedings{GuptaK19-1,
  title = {Optimization of Multiple Physical Phenomena through a Universal Metric in Junctionless Transistors},
  author = {Manish Gupta and Abhinav Kranti},
  year = {2019},
  doi = {10.1109/VLSID.2019.00048},
  url = {https://doi.org/10.1109/VLSID.2019.00048},
  researchr = {https://researchr.org/publication/GuptaK19-1},
  cites = {0},
  citedby = {0},
  pages = {168-173},
  booktitle = {32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems, VLSID 2019, Delhi, India, January 5-9, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-0409-6},
}