Manish Gupta, Abhinav Kranti. Optimization of Multiple Physical Phenomena through a Universal Metric in Junctionless Transistors. In 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems, VLSID 2019, Delhi, India, January 5-9, 2019. pages 168-173, IEEE, 2019. [doi]
@inproceedings{GuptaK19-1, title = {Optimization of Multiple Physical Phenomena through a Universal Metric in Junctionless Transistors}, author = {Manish Gupta and Abhinav Kranti}, year = {2019}, doi = {10.1109/VLSID.2019.00048}, url = {https://doi.org/10.1109/VLSID.2019.00048}, researchr = {https://researchr.org/publication/GuptaK19-1}, cites = {0}, citedby = {0}, pages = {168-173}, booktitle = {32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems, VLSID 2019, Delhi, India, January 5-9, 2019}, publisher = {IEEE}, isbn = {978-1-7281-0409-6}, }