Amit Kumar Gupta, Appa Iyer Sivakumar, Viswanath Kumar Ganesan. Look ahead batching to minimize earliness/tardiness measures in batch processes. In 2004 IEEE Conference on Robotics, Automation and Mechatronics, RAM 2004, December 1-3, 2004, Singapore. pages 1101-1106, IEEE, 2004. [doi]
Abstract is missing.