Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system

G. Haberfehlner, Scrgey Bychikhin, V. Dubec, Michael Heer, A. Podgaynaya, M. Pfost, M. Stecher, Erich Gornik, Dionyz Pogany. Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectronics Reliability, 49(9-11):1346-1351, 2009. [doi]

Abstract

Abstract is missing.