A methodology for the insertion of a hierarchical and boundary-scan compatible self test - researchr publication

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Oliver F. Haberl, Thomas Kropf. A methodology for the insertion of a hierarchical and boundary-scan compatible self test. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 37-42, IEEE, 1992. [doi]

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