Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors

S. Haendler, J. Jomaah, G. Ghibaudo, F. Balestra. Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors. Microelectronics Reliability, 41(6):855-860, 2001. [doi]

Authors

S. Haendler

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J. Jomaah

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G. Ghibaudo

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F. Balestra

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