Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors

S. Haendler, J. Jomaah, G. Ghibaudo, F. Balestra. Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors. Microelectronics Reliability, 41(6):855-860, 2001. [doi]

@article{HaendlerJGB01,
  title = {Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors},
  author = {S. Haendler and J. Jomaah and G. Ghibaudo and F. Balestra},
  year = {2001},
  doi = {10.1016/S0026-2714(01)00021-X},
  url = {http://dx.doi.org/10.1016/S0026-2714(01)00021-X},
  tags = {analysis},
  researchr = {https://researchr.org/publication/HaendlerJGB01},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {41},
  number = {6},
  pages = {855-860},
}