Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
S. Haendler, J. Jomaah, G. Ghibaudo, F. Balestra. Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors. Microelectronics Reliability, 41(6):855-860, 2001. [doi]