Mohammad Hashem Haghbayan, Antonio Miele, Zhuo Zou, Hannu Tenhunen, Juha Plosila. Thermal-Cycling-aware Dynamic Reliability Management in Many-Core System-on-Chip. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 1229-1234, IEEE, 2020. [doi]
Abstract is missing.