Oxide-based RRAM models for circuit designers: A comparative analysis

Basma Hajri, Mohammad M. Mansour, Ali Chehab, Hassen Aziza. Oxide-based RRAM models for circuit designers: A comparative analysis. In 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2017, Palma de Mallorca, Spain, April 4-6, 2017. pages 1-6, IEEE, 2017. [doi]

Abstract

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