A Serially Addressable, Flexible Current Monitor for Test Fixture Based I::DDQ::/I::SSQ:: Testing - researchr publication

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Alan Hales. A Serially Addressable, Flexible Current Monitor for Test Fixture Based I::DDQ::/I::SSQ:: Testing. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 223-232, IEEE Computer Society, 1994.

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