Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests

Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers. Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests. J. Electronic Testing, 19(2):195-205, 2003. [doi]

Abstract

Abstract is missing.