Carter Hamilton, Gretchen Gibson, Sajitha Wijesuriya, Charles E. Stroud. Enhanced Bist-Based Diagnosis of FPGAs via Boundary Scan Access. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 413-419, IEEE Computer Society, 1999. [doi]
Abstract is missing.