Sangwoo Han, Byung-Su Kim, Juho Kim. Variation-Aware Aging Analysis in Digital ICs. IEEE Trans. VLSI Syst., 21(12):2214-2225, 2013. [doi]
@article{HanKK13-0,
title = {Variation-Aware Aging Analysis in Digital ICs},
author = {Sangwoo Han and Byung-Su Kim and Juho Kim},
year = {2013},
doi = {10.1109/TVLSI.2012.2228886},
url = {http://dx.doi.org/10.1109/TVLSI.2012.2228886},
researchr = {https://researchr.org/publication/HanKK13-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {21},
number = {12},
pages = {2214-2225},
}