Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern

Jeong Han, Norman Kim, Bong-Jin Yum, Myong K. Jeong. Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern. Expert Syst. Appl., 38(11):13857-13862, 2011. [doi]

Abstract

Abstract is missing.