The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit

Ming-Hung Han, Yiming Li, Chih-Hong Hwang. The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit. Microelectronics Reliability, 50(5):657-661, 2010. [doi]

Abstract

Abstract is missing.