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The improvement of HEIP immunity using STI engineering at DRAM

Seung Uk Han, Youngyoun Lee, Yongdoo Kim, Jemin Park, Junhee Lim, Satoru Yamada, Hyeongsun Hong, Kyupil Lee, Gyoyoung Jin, Eunseung Jung. The improvement of HEIP immunity using STI engineering at DRAM. Microelectronics Reliability, 76:164-167, 2017. [doi]

Authors

Seung Uk Han

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Youngyoun Lee

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Yongdoo Kim

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Jemin Park

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Junhee Lim

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Satoru Yamada

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Hyeongsun Hong

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Kyupil Lee

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Gyoyoung Jin

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Eunseung Jung

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