Ling Hao, John C. Gallop, Jie Chen 0016. Electromagnetic Metrology for Nano- Electromechanical Systems. IEEE T. Instrumentation and Measurement, 68(6):1827-1832, 2019. [doi]
@article{HaoGC19,
title = {Electromagnetic Metrology for Nano- Electromechanical Systems},
author = {Ling Hao and John C. Gallop and Jie Chen 0016},
year = {2019},
doi = {10.1109/TIM.2018.2879068},
url = {https://doi.org/10.1109/TIM.2018.2879068},
researchr = {https://researchr.org/publication/HaoGC19},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {68},
number = {6},
pages = {1827-1832},
}