A new metric for fault-tolerance in sensor networks

Bin Hao, Arunabha Sen, Bao-Hong Shen. A new metric for fault-tolerance in sensor networks. In John A. Stankovic, Anish Arora, Ramesh Govindan, editors, Proceedings of the 2nd International Conference on Embedded Networked Sensor Systems, SenSys 2004, Baltimore, MD, USA, November 3-5, 2004. pages 289-290, ACM, 2004. [doi]

Abstract

Abstract is missing.