Analyzing technology development trend based on patent data

Xinning Hao, Nengfu Xie, Wei Sun. Analyzing technology development trend based on patent data. In Xiang Fei, Lipo Wang, Chunlei Ji, Qiang Sun 0005, Niansheng Chen, Xiaoyong Song, Xin Wang 0034, editors, 3rd International Conference on Systems and Informatics, ICSAI 2016, Shanghai, China, November 19-21, 2016. pages 1056-1061, IEEE, 2016. [doi]

Abstract

Abstract is missing.