Dan Hao, Lu Zhang, Hao Zhong, Hong Mei, Jiasu Sun. Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study. In 21st IEEE International Conference on Software Maintenance (ICSM 2005), 25-30 September 2005, Budapest, Hungary. pages 683-686, IEEE Computer Society, 2005. [doi]
Abstract is missing.