Stress direction and temperature detectable octagonal nMOSFET multi operation device

Tomochika Harada, Koyo Kaiwa. Stress direction and temperature detectable octagonal nMOSFET multi operation device. In International Symposium on Intelligent Signal Processing and Communication Systems, ISPACS 2016, Phuket, Thailand, October 24-27, 2016. pages 1-5, IEEE, 2016. [doi]

Abstract

Abstract is missing.