A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test - researchr publication

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Masaru Haraguchi, Tokuya Osawa, Akira Yamazaki, Chikayoshi Morishima, Toshinori Morihara, Yoshikazu Morooka, Yoshihiro Okuno, Kazutami Arimoto. A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test. IEICE Transactions, 92-C(4):453-459, 2009. [doi]

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