Exact scalable sensitivity analysis for the next release problem

Mark Harman, Jens Krinke, Inmaculada Medina-Bulo, Francisco Palomo-Lozano, Jian Ren, Shin Yoo. Exact scalable sensitivity analysis for the next release problem. ACM Transactions on Software Engineering Methodology, 23(2):19, 2014. [doi]

Abstract

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