Modelling and mitigation of time-zero variability in sub-16nm finfet-based STT-MRAM memories

Matthias Hartmann, Halil Kükner, Prashant Agrawal, Praveen Raghavan, Liesbet Van der Perre, Wim Dehaene. Modelling and mitigation of time-zero variability in sub-16nm finfet-based STT-MRAM memories. In Joseph R. Cavallaro, Tong Zhang 0002, Alex K. Jones, Hai Helen Li, editors, Great Lakes Symposium on VLSI 2014, GLSVLSI '14, Houston, TX, USA - May 21 - 23, 2014. pages 243-244, ACM, 2014. [doi]

Abstract

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