Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing. Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 371-376, IEEE, 2011. [doi]
Abstract is missing.