Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi. Enhancing error resilience for reliable compression of VLSI test data. In John Lach, Gang Qu, Yehea I. Ismail, editors, Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005. pages 371-376, ACM, 2005. [doi]
Abstract is missing.