Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada. Electric field for detecting open leads in CMOS logic circuits by supply current testing. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 2995-2998, IEEE, 2005. [doi]
Abstract is missing.