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Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage

Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault. Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage. IEEE Trans. VLSI Syst., 28(3):764-776, 2020. [doi]

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