Angle-resolved photoelectron spectroscopy on gate insulators

T. Hattori, H. Nohira, S. Shinagawa, M. Hori, M. Kase, T. Maruizumi. Angle-resolved photoelectron spectroscopy on gate insulators. Microelectronics Reliability, 47(1):20-26, 2007. [doi]

Abstract

Abstract is missing.