M. Hauser, P. Srinivasan 0002, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min. Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 5, IEEE, 2022. [doi]
Abstract is missing.