Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs

K. Hayama, K. Takakura, H. Ohyama, S. Kuboyama, S. Matsuda, J. M. RafĂ­, A. Mercha, E. Simoen, C. Claeys. Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. Microelectronics Reliability, 45(9-11):1376-1381, 2005. [doi]

Abstract

Abstract is missing.