Test data compression technique using selective don t-care identification

Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase. Test data compression technique using selective don t-care identification. In Masaharu Imai, editor, Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, Yokohama, Japan, January 27-30, 2004. pages 230-233, IEEE, 2004. [doi]

Abstract

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